Research Output
Journal articles, conference papers, and thesis — spanning 2011 to 2026.
T. Ravelet, J.-M. Dutertre, R. Viera, R. S. Lima, N. Falletto, F. Le Mounier, “Faulting an 8 nm FinFET technology SoC using Photon Emission Microscopy-assisted LFI,”
IACR Transactions on Cryptographic Hardware and Embedded Systems (TCHES), vol. 2026, no. 4, pp. 815–837, 2026.
H. Perrin, J.-B. Rigaud, R. Viera, “Thermal Laser Stimulation of Bulk Built-In Current Sensors in Silicon Devices,”
IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2026.
L. Santana, R. Viera, J.-B. Rigaud, M. Muller, G. Ishkhanyan, L. Le-Brizoual, L. Pichon, “On-Chip Frequency-to-Voltage Conversion for Hardware Security Characterization,”
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2026.
R. Nabhan, M. Ebrahimabadi, J.-L. Danger, J.-M. Dutertre, S. Guilley, N. Karimi, R. Viera, I. Zaarour, “HEED: A Highly Efficient Electromagnetic Fault Detection Scheme,”
Design, Automation and Test in Europe (DATE), 2026.
R. Viera, N. Backert, J.-M. Dutertre, “Power-Off Laser Attack Against Bulk Built-in Current Sensors,”
International Symposium on Quality Electronic Design (ISQED), 2026.
M. Ebrahimabadi, R. Viera, S. Guilley, J.-L. Danger, J.-M. Dutertre, N. Karimi, “Multi-Sensor Data Fusion for Enhanced Detection of Laser Fault Injection Attacks in Cryptographic Hardware: Practical Results,”
Design, Automation and Test in Europe (DATE), 2025.
R. Viera, J.-M. Dutertre, R. S. Lima, M. Pommiès, A. Bertrand, “Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations,”
Journal of Cryptographic Engineering, vol. 14, pp. 207–221, 2024 (online 2023).
M. Ebrahimabadi et al. incl. R. Viera, “DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors,”
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2024 (online 2023).
R. S. Lima, R. Viera, J.-M. Dutertre, M. Pommiès, A. Bertrand, “Reverse-Engineering and Data Extraction from SRAM using Photon Emission Analysis,”
IEEE Physical Assurance and Inspection of Electronics (PAINE), 2024.
R. S. Lima, R. Viera et al., “When Data Shines — Leaking Data from Microcontrollers Through Photon Emission Analysis,”
Workshop on Attacks and Solutions in Hardware Security (ASHES), 2024.
R. S. Lima et al. incl. R. Viera, “Target Preparation Methodology for Semi-Invasive Attacks on Microcontrollers,”
IEEE Physical Assurance and Inspection of Electronics (PAINE), 2022.
M. Ebrahimabadi et al. incl. R. Viera, “Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors,”
IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2022.
R. Viera et al., “Injecting Permanent Faults into the Flash Memory of a Microcontroller with Laser Illumination During Read Operations,”
ACM Workshop on Attacks and Solutions in Hardware Security (ASHES), 2022.
W. S. da Cruz et al. incl. R. Viera, “An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation,”
IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2022.
W. S. da Cruz et al. incl. R. Viera, “Further Analysis of Laser-induced IR-drop,”
IEEE Asian Test Symposium (ATS), 2021.
R. Viera et al., “Permanent Laser Fault Injection into the Flash Memory of a Microcontroller,”
IEEE International NEWCAS Conference, 2021.
M. Dumont et al. incl. R. Viera, “An Overview of Laser Injection against Embedded Neural Network Models,”
IEEE World Forum on Internet of Things (WF-IoT), 2021.
R. A. C. Viera, P. Maurine, J.-M. Dutertre, R. Possamai Bastos, “Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection,”
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 39, no. 6, pp. 1231–1244, 2020 (online 2019).
R. Possamai Bastos et al. incl. R. Viera, “Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron-Induced Transients,”
IEEE Transactions on Nuclear Science (TNS), 2020.
M. G. Trindade et al. incl. R. Viera, “Assessment of a Hardware-Implemented Machine Learning Technique Under Neutron Irradiation,”
IEEE Transactions on Nuclear Science (TNS), 2019.
PhD Thesis
R. Viera, “Simulating and modeling the effects of laser fault injection on integrated circuits,”
Université de Montpellier, 2018. PDF
R. Viera et al., “Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits,”
ACM International Symposium on Physical Design (ISPD), 2018.
R. Viera et al., “Assessing body built-in current sensors for detection of multiple transient faults,”
Microelectronics Reliability, 2018.
R. A. C. Viera, R. Possamai Bastos, J.-M. Dutertre, P. Maurine, R. Iga Jadue, “Method for evaluation of transient-fault detection techniques,”
Microelectronics Reliability, vols. 76–77, pp. 68–74, 2017.
R. Viera et al., “Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation,”
Euromicro Conference on Digital System Design (DSD), 2017.
R. Viera et al., “Importance of IR drops on the modeling of laser-induced transient faults,”
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2017.
R. A. C. Viera, J. de La Cruz, A. L. Aita, C. A. Prior, J. B. Martins, “System-Level Design of Single-Bit Sigma-Delta Modulators Based on MSA and SNR Data Graphics,”
ACM/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI), 2015.
R. Viera et al., “Validation of single BBICS architecture in detecting multiple faults,”
IEEE Asian Test Symposium (ATS), 2015.
R. Viera et al., “System-Level Design of a Reconfigurable CT ΣΔ Modulator for Multi-Standard Wireless Applications,”
ACM/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI), 2014.
R. Viera et al., “Iterative Mode Hardware Implementation of CORDIC Algorithm,”
26th South Symposium on Microelectronics (SIM), 2011.